Purpose

This product is applicable for t h e safe performance test of electronic components and parts and provides the reliable test and product selection t e st etc; through the chamber test,（ linpin） the product re l iability can be improved and the quality control can be conducted.

Chamber Structure

All functions adopt the computer control with g ood operation interface so as to ensure the user ’s operation and monitoring is more s i mple and straightforward（ linpin） .
The cold chamber and hot chamber are c o ntrolled independently and the chamber doors are independent of each other so as to enlarge the use range o f the test chamber （1 chamber for 3 purposes）（ linpin） .
A standard lead hole pipe is in s talled on the top of the chamber in order to facilitate users to lead sensor cable,（ linpin） inspection cable etc i n to the chamber.

Control System

The switching time between low te mp erature zone and high temperature zo n e is not more than 15sec.
The temperature recovery time is not more than 5min.

Standards Applied

GB/T2423.1.2, GB1 0 592-89, GJB150

Specs & Technical Parameters